On TV.com: THE PRISONER Didn't Hold Us Captive
BNET Business Network:
BNET
TechRepublic
ZDNet

FREE Registration is required

Overview:

Developers moving to multi-threaded applications need advanced new testing capabilities to help them control this new cause of software complexity. Because they are nearly impossible to replicate in dynamic testing environments, static analysis is uniquely suited to play an important role in eliminating concurrency defects early in the software development lifecycle. However, due to their underlying complexity, some concurrency defect types have historically escaped detection by conventional static analysis tools. Today, sophisticated new technology from Coverity is advancing the science of static analysis to help developers meet the challenge of creating multi-threaded applications. By arming developers with static analysis capabilities that detect complex concurrency defects early in the development lifecycle, organizations will accelerate their ability to produce and release multi-threaded applications with greater confidence.

(Is this item miscategorized? Does it need more tags? Let us know.)

Format:PDFSize:134 KB
Date:Jul 2008
Pages:13

Top results from Software Engineering

Webcast Live Webcast: Get Control over SaaS Application Access
White Paper Number Systems Decoded - Binary, Decimal, and Hexadecimal
White Paper 5 Rules of Effective Negotiating
White Paper Practical Approaches for Securing Web Applications across the Software Delivery Lifecycle
Webcast On Demand Webcast: A Smarter way to Successful SOA - Information as a trusted strategic asset

» View all Software Engineering listings

Top results from Programming Languages

White Paper Designing High Availability for Internet Information Services
White Paper Number Systems Decoded - Binary, Decimal, and Hexadecimal
White Paper 5 Rules of Effective Negotiating
White Paper The Scoop on the New CCNA and CCNP Specializations
White Paper Citizants: Bringing IT In-House

» View all Programming Languages listings

advertisement
Click Here

White Papers, Webcasts, and Resources

Featured Training Courses

SmartPlanet

Click Here

Returning users: Log In Here!

Already registered on BNET, TechRepublic, or ZDNet? Simply log in.

Free Membership: Sign Up Now!

Sign up for a free membership today and get instant and unlimited access to one of the largest databases of white papers, webcasts, and casestudies anywhere. Your FREE membership allows you to:

  • Download an unlimited amount of content, including classic and current white papers, case studies, webcasts and more
  • Track content on your chosen topics of interest
  • Receive targeted email alerts when your favorite content is added
  • Save content for future reading
  • Receive our member newsletter

When you register to access this library, you allow us to share your information with companies that produce products or services featured in the library--so that such companies may contact you with information and offers regarding their products and services. This enables us to keep the library a free service. As a library registrant, you will receive a complimentary subscription to the ZDNet white paper newsletter and e-mail Must-Read News Alerts. You can unsubscribe from these at any time. By clicking the Sign up button, you indicate that you agree to our Terms and Conditions and have read and understand our Privacy Policy (updated).